Scanning Electrochemical Workstation Software
The Scanning Electrochemical Workstation software provides unique capabilities and interactivity in support of the Model 370 and Model 470 nanometre-resolution scanning probe microscopes. The software is designed with the user in mind:
- To enhance data analysis, manipulation and interactivity.
- To ease research by automating measurements and sequencing.
Over 40 discrete experiments provided throughout, each with their own individual variations such as:
- Height-Tracking (above surface)
- Surface-Tracking (on surface)
- Step Scan
- Sweep Scan
- Pre-Delays, Line-Delays, Velocities, Step Sizes, Scan Dimensions, Signal Conditioning Parameters, Control Loop Parameters, Potentiostat Setting etc.
The Software provides both 64bit and 32bit WindowsTM support in a standard Multiple Document Interface (MDI) application that supports all standard WindowsTM features.
The Software is completely self-contained in a single application, and contains:
|• Electrochemistry suite||(EChem)||√||√|
|• Corrosion suite||(ECorr)||√||√|
|• Scanning Electrochemical Microscopy||(SECM)||√||√|
|• alternating-current Scanning Electrochemical Microscopy||(ac-SECM)||√|
|• intermittent-contact Scanning Electrochemical Microscopy||(ic-SECM)||√|
|• combined ic-ac Scanning Electrochemical Microscopy||(ic-ac-SECM)||√|
|• Scanning Vibrating Electrode||(SVET)||√||√|
|• Scanning Kelvin Probe||(SKP)||√||√|
|• Capacitive Height Measurement/Tracking||(CHM / CTM)||√||√|
|• Localised Electrochemical Impedance Spectroscopy||(LEIS)||√||√|
|• Scanning Droplet System / Cell||(SDS / SDC)||√||√|
|• alternating-current Scanning Droplet System/ Cell||(ac-SDS / ac-SDC)||√|
|• Non-contact Optical Surface Profiling (Laser based)||(OSP)||√||√|