Scanning probe workstation
SECM150 sets a new standard for value in SECM research. SECM150 is a compact and value-oriented scanning electrochemical microscope that allows the user to perform local investigation on electrodes in any environment. The SECM150 combines high performance and ease-of-use.
The new standard for value in SECM research !
So compact that it fits in a glove box!
Ultra high resolution <10 nm scanning resolution
The probe used in this technique is a tapered disk ultramicroelectrode. The resolution depends on the size of the electrode. The system is provided with a positioning system, a control box hosting two pstat/gstats/FRA to polarize both the sample and the electrode.
Alternating and direct current Scanning Electrochemical Microscope.
Measures the local electrochemical reactivity of a surface using dc current or the impedance of the probe.
The SECM probe maintained at a constant distance from the sample. Rough, large, uneven samples can be studied using this mode with dc- or ac-SECM. In addition to an ac/dc-SECM system, it only requires an additional piezo element and two LIAs (Lock-In Amplifier) hosted by the control box.
Intermittent contact SECM.
Measures the local reactivity of a surface at a constant distance, instead of constant height.
Two scanning heads are offered in this technique: in the first one the electrolyte flowing in the droplet is renewed. In the second the electrolyte in the droplet is static. The system includes a positioning system, an pstat/gstat/FRA that can be hosted in the control box.
Alternating and direct current Scanning Droplet System.
Uses a small droplet as an electrolyte and allows the user to select a small area of the sample and interrogate it using classical dc or ac electrochemistry techniques.
The local ac current flowing from the sample under sinusoidal potential modulation and leading to the local impedance of the sample is measured by a bi-electrode probe. The system includes a positioning system, an electrometer board, a pstat/gstat/FRA board, all can be hosted in the control box.
Localized Electrochemical Impedance Spectroscopy.
Measures a full impedance graph at a specific point or the spatially resolved impedance at one single frequency of a conducting sample.
The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.
Optical Surface Profiler.
Measures the topography and roughness of a sample using diffracted light from a laser beam.
Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.
Scanning Kelvin Probe.
Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.
This technique uses a single wire probe to measure the voltage difference in a solution related to local currents flowing from a corroding or polarized sample. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier) and optionally a pstat/gstat/FRA board, all can be hosted in the control box.
Scanning Vibrating Electrode Technique.
Measures local anodic and cathodic currents from a free corroding or polarized sample.