M370 – SKP

Signal chain

  • Phase sensitive detection using microprocessor controlled lock-in amplifier with digital dual phase oscillator and differential electrometer input.

Lock-in amplifier

  • Software controllable gain range. Gain 1-105.
  • Maximum theoretical sensitivity 0.5 µV FSD.
  • Output time constant 0.1, 1, 10 s.

Differential electrometer

  • 1015 Ohms input impedance.
  • Decade gain ranges 0 to 80 dB.
  • Common mode range ±12 V.

Vibration actuator: 

  • One dimensional low voltage piezo-electric actuator.

Vibration amplitude (±10%): Software set from 0 – 30 µm perpendicular to sample surface.

Backing potential controller

  • Potential range ±10 V
  • DAC resolution 300 μV.
  • Sampling 0.1 to 1000 Hz.
  • Type PID Controller

Probe type: SKPR Tungsten air gap.

Electrochemical sensitivity: Better than 0.15 meV.

 

 

Positioning system specifications

Stepper Motors

  • Scan range (x, y, z) mm: 70 mm x 70 mm x 70 mm.
  • Minimal step size on all axes: 1 µm
  • Closed loop positioning linear zero hysteresis encoder with direct real-time readout of displacement in x, y and z
  • Linear position encoder resolution: 100 nm.
  • Maximum scan speed: 2 mm/s.
  • Measurement resolution: 16 Bit @100kHz.
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    Ability to make measurements in a humid or gaseous environment.

    The Scanning Kelvin Probe (SKP) is a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a metallic probe.

    The technique operates using a vibrating capacitance probe, and through a swept backing potential, the work function difference is measured between the scanning probe reference tip and sample surface.

    The work function can be directly correlated to the surface condition. A unique aspect of the SKP is its ability to make measurements in a humid or gaseous environment.

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