M370 – SKP
- Phase sensitive detection using microprocessor controlled lock-in amplifier with digital dual phase oscillator and differential electrometer input.
- Software controllable gain range. Gain 1-105.
- Maximum theoretical sensitivity 0.5 µV FSD.
- Output time constant 0.1, 1, 10 s.
- 1015 Ohms input impedance.
- Decade gain ranges 0 to 80 dB.
- Common mode range ±12 V.
- One dimensional low voltage piezo-electric actuator.
Vibration amplitude (±10%): Software set from 0 – 30 µm perpendicular to sample surface.
Backing potential controller
- Potential range ±10 V
- DAC resolution 300 μV.
- Sampling 0.1 to 1000 Hz.
- Type PID Controller
Probe type: SKPR Tungsten air gap.
Electrochemical sensitivity: Better than 0.15 meV.
Positioning system specifications
- Scan range (x, y, z) mm: 70 mm x 70 mm x 70 mm.
- Minimal step size on all axes: 1 µm
- Closed loop positioning linear zero hysteresis encoder with direct real-time readout of displacement in x, y and z
- Linear position encoder resolution: 100 nm.
- Maximum scan speed: 2 mm/s.
- Measurement resolution: 16 Bit @100kHz.
Ability to make measurements in a humid or gaseous environment.
The Scanning Kelvin Probe (SKP) is a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a metallic probe.
The technique operates using a vibrating capacitance probe, and through a swept backing potential, the work function difference is measured between the scanning probe reference tip and sample surface.
The work function can be directly correlated to the surface condition. A unique aspect of the SKP is its ability to make measurements in a humid or gaseous environment.