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Scanning probe workstation

SECM150

SECM150

SECM150 sets a new standard for value in SECM research. SECM150 is a compact and value-oriented scanning electrochemical microscope that allows the user to perform local investigation on electrodes in any environment. The SECM150 combines high performance and ease-of-use.

The new standard for value in SECM research !
So compact that it fits in a glove box!
Ultra high resolution <10 nm scanning resolution

M470 – ac/dc-SECM

M470 – ac/dc-SECM

The probe used in this technique is a tapered disk ultramicroelectrode. The resolution depends on the size of the electrode. The system is provided with a positioning system, a control box hosting two pstat/gstats/FRA to polarize both the sample and the electrode.

Alternating and direct current Scanning Electrochemical Microscope.
Measures the local electrochemical reactivity of a surface using dc current or the impedance of the probe.

M470 – ic-SECM

M470 – ic-SECM

The SECM probe maintained at a constant distance from the sample. Rough, large, uneven samples can be studied using this mode with dc- or ac-SECM. In addition to an ac/dc-SECM system, it only requires an additional piezo element and two LIAs (Lock-In Amplifier) hosted by the control box.

Intermittent contact SECM.
Measures the local reactivity of a surface at a constant distance, instead of constant height.

M470 – ac/dc-SDS

M470 – ac/dc-SDS

Two scanning heads are offered in this technique: in the first one the electrolyte flowing in the droplet is renewed. In the second the electrolyte in the droplet is static. The system includes a positioning system, an pstat/gstat/FRA that can be hosted in the control box.

Alternating and direct current Scanning Droplet System.
Uses a small droplet as an electrolyte and allows the user to select a small area of the sample and interrogate it using classical dc or ac electrochemistry techniques.

M470 – LEIS

M470 – LEIS

The local ac current flowing from the sample under sinusoidal potential modulation and leading to the local impedance of the sample is measured by a bi-electrode probe. The system includes a positioning system, an electrometer board, a pstat/gstat/FRA board, all can be hosted in the control box.

Localized Electrochemical Impedance Spectroscopy.
Measures a full impedance graph at a specific point or the spatially resolved impedance at one single frequency of a conducting sample.

M470 – OSP

M470 – OSP

The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.

Optical Surface Profiler.
Measures the topography and roughness of a sample using diffracted light from a laser beam.

M470 – SKP

M470 – SKP

Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.

Scanning Kelvin Probe.
Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.

M470 – SVP

M470 – SVP

This technique uses a single wire probe to measure the voltage difference in a solution related to local currents flowing from a corroding or polarized sample. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier) and optionally a pstat/gstat/FRA board, all can be hosted in the control box.

Scanning Vibrating Electrode Technique.
Measures local anodic and cathodic currents from a free corroding or polarized sample.

M370 – OSP

M370 – OSP

The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.

Optical Surface Profiler.
Measures the topography and roughness of a sample using diffracted light from a laser beam.

M370 – dc-SDS

M370 – dc-SDS

Two scanning heads are offered in this technique: in the first one the electrolyte flowing in the droplet is renewed. In the second the electrolyte in the droplet is static. The system includes a positioning system, two control boxes hosting the pstat/gstat and the positioning control.

Alternating and direct current Scanning Droplet System.
Uses a small droplet as an electrolyte and allows the user to select a small area of the sample and interrogate it using classical dc electrochemistry techniques.

M370 – LEIS

M370 – LEIS

Using a bi-electrode probe, the local ac current flowing from the sample under sinusoidal potential modulation and leading to the local impedance of the sample is measured. The system includes a positioning system, an electrometer board, a pstat/gstat/FRA, in two different chassis.

Localized Electrochemical Impedance Spectroscopy.
Measures a full impedance graph at a specific point or the spatially resolved impedance at one single frequency of a conducting sample.

M370 – SKP

M370 – SKP

Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.

Scanning Kelvin Probe.
Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.

M370 – SVP

M370 – SVP

This technique uses a single wire probe to measure the voltage difference in a solution related to local currents flowing from a corroding or polarized sample. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier) and optionally a pstat/gstat, all are hosted in the control boxes.

Scanning Vibrating Electrode Technique.
Measures local anodic and cathodic currents from a free corroding or polarized sample.

M370 – dc-SECM

M370 – dc-SECM

The probe used in this technique is a tapered disk ultramicroelectrode. The resolution depends on the size of the electrode. The system is provided with a positioning system, two control boxes hosting the two pstat/gstats and the positioning control.

Direct current Scanning Electrochemical Microscope.
Measures the local electrochemical reactivity of a surface using dc current.