Topography

Whether it is because the sample of interest is not flat or rough after intense corrosion, or because the coating has been homogeneously deposited, it can often be interested to have information on the topographical properties of your sample. We provide scanning techniques that can give access to this information, which is not electrochemical per se but can affect the local, spatial electrochemistry. The literature below gives a few examples of such interactions.

Literature

AN#1 – Height tracking with the SKP370 or SKP470 module
AN#2 – SECM height relief with OSP: An application in corrosion
AN#3 – SECM height relief with OSP: an application in sensors
AN#4 – Post-treatment and optimization of area scan experiments
AN#5 – Introducing the Microscopic Image Rapid Analysis (MIRA) software
AN#8 – Graphical and analysis tools in M370/M470 software
AN#12 – 3D Map production using the 3DIsoPlot software
AN#16 – Intermittent Contact (ic) SECM for relief of major topographic features
AN#17 – The use of height tracking SECM to measure mechanically exfoliated graphite

Related instruments

  • M370 – OSP

    M370 – OSP

    The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.

    Optical Surface Profiler.
    Measures the topography and roughness of a sample using diffracted light from a laser beam.

  • M370 – SKP

    M370 – SKP

    Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.

    Scanning Kelvin Probe.
    Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.

  • M470 – ic-SECM

    M470 – ic-SECM

    The SECM probe maintained at a constant distance from the sample. Rough, large, uneven samples can be studied using this mode with dc- or ac-SECM. In addition to an ac/dc-SECM system, it only requires an additional piezo element and two LIAs (Lock-In Amplifier) hosted by the control box.

    Intermittent contact SECM.
    Measures the local reactivity of a surface at a constant distance, instead of constant height.

  • M470 – OSP

    M470 – OSP

    The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.

    Optical Surface Profiler.
    Measures the topography and roughness of a sample using diffracted light from a laser beam.

  • M470 – SKP

    M470 – SKP

    Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.

    Scanning Kelvin Probe.
    Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.

  • SP-200

    SP-200

    Compact and powerful in a portable chassis

    The SP-200 is a fast & sensitive high end potentiostat/galvanostat.

    Channel: single
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +/- 500 mA
    Voltage range: -10 V to +10 V
    with option: -10 V to +10 V
    EIS: up to 7 MHz

  • SP-300

    SP-300

    Fast, Sensitive, stable and modular

    SP-300 is a state-of-the-art modular high end potentiostat / galvanostat / FRA with remarkable specifications.

    Channel: single/bipot
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +-A30
    Voltage range: -10V to +10V
    with option: -48V to +48V
    EIS: up to 7 MHz

  • VMP-300

    VMP-300

    A new step in the combination of performance and versatility

    VMP-300 is an ultimate and modular 16 channel potentiostat/galvanostat

     

    Channel: bipot/multi
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +/-150 A
    Voltage range: -10 V to +10 V
    with option: -48 V to +48 V
    EIS: up to 7 MHz

  • VSP-300

    VSP-300

    Fast, sensitive, stable and modular… a remarkable combination!!!

    VSP-300 is a state-of-the-art high end potentiostat / galvanostat / FRA with remarkable specifications.

    Channel: bipot/multi
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +/-40 A
    Voltage range: -10 V to +10 V
    with option: -48V to +48V
    EIS: up to 7 MHz