Related instruments

  • SP-300

    SP-300

    Fast, Sensitive, stable and modular

    SP-300 is a state-of-the-art modular high end potentiostat / galvanostat / FRA with remarkable specifications.

    Channel: single/bipot
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +-A30
    Voltage range: -10V to +10V
    with option: -48V to +48V
    EIS: up to 7 MHz

  • SP-200

    SP-200

    Compact and powerful in a portable chassis

    The SP-200 is a fast & sensitive high end potentiostat/galvanostat.

    Channel: single
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +/- 500 mA
    Voltage range: -10 V to +10 V
    with option: -10 V to +10 V
    EIS: up to 7 MHz

  • VMP-300

    VMP-300

    A new step in the combination of performance and versatility

    VMP-300 is an ultimate and modular 16 channel potentiostat/galvanostat

     

    Channel: bipot/multi
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +/-150 A
    Voltage range: -10 V to +10 V
    with option: -48 V to +48 V
    EIS: up to 7 MHz

  • VSP-300

    VSP-300

    Fast, sensitive, stable and modular… a remarkable combination!!!

    VSP-300 is a state-of-the-art high end potentiostat / galvanostat / FRA with remarkable specifications.

    Channel: bipot/multi
    Min current dynamic: +/-100 pA
    Min with LC/ULC option: +/-100 fA
    Max current dynamic: +/-500 mA
    Max with current booster option: +/-40 A
    Voltage range: -10 V to +10 V
    with option: -48V to +48V
    EIS: up to 7 MHz

  • M470 – ic-SECM

    M470 – ic-SECM

    The SECM probe maintained at a constant distance from the sample. Rough, large, uneven samples can be studied using this mode with dc- or ac-SECM. In addition to an ac/dc-SECM system, it only requires an additional piezo element and two LIAs (Lock-In Amplifier) hosted by the control box.

    Intermittent contact SECM.
    Measures the local reactivity of a surface at a constant distance, instead of constant height.

  • M470 – SKP

    M470 – SKP

    Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.

    Scanning Kelvin Probe.
    Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.

  • M470 – OSP

    M470 – OSP

    The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.

    Optical Surface Profiler.
    Measures the topography and roughness of a sample using diffracted light from a laser beam.

  • M370 – SKP

    M370 – SKP

    Using a metallic probe shielded by a metallic cylinder, the Kelvin potential, also named surface potential difference, related to the work function difference, is measured. The system includes a positioning system, an electrometer board, an LIA (Lock-In Amplifier), all are hosted in the control box.

    Scanning Kelvin Probe.
    Measures the local Kelvin potential, which is related to work function difference between the tip and the sample.

  • M370 – OSP

    M370 – OSP

    The OSP scanning head is used with a bespoke that allows all the various modes of operation to be performed. In addition to topography; transparent films thickness can also be measured. The system includes a positioning system, an OSP head and an OSP board.

    Optical Surface Profiler.
    Measures the topography and roughness of a sample using diffracted light from a laser beam.