The purpose of the application notes is two-folded: i) to introduce or illustrate new features: technique, analysis tool (for example CASP, DCS, MIRA, ic-SECM, EKKO…), ii) to show how our instruments and software can be used within a specific application (photovoltaic materials, supercapacitors, batteries, proteins…) and which information can be obtained. The application notes are sorted by divisions.
The main subjects covered are: electrochemical impedance spectroscopy, battery investigation, analytical electrochemistry, corrosion and energy.
AN#1 – Protocols for studying intercalation electrodes materials: Part I: Galvanostatic cycling with potential limitation (GCPL)
AN#2 – Protocols for studying intercalation electrodes materials: Part II: Potentiodynamic Cycling with Galvanostatic Acceleration (PCGA)
AN#3 – Galvanostatic Cycling with Potential limitation 4: Low Earth Orbit battery satellite protocol
AN#4 – Potentiostat stability mystery explained
AN#5 – Precautions for good impedance measurements
AN#6 – Constant power technique
AN#7 – Application of the bipotentiostat to an experiment with a rotating ring-disk electrode.
AN#8 – Impedance, admittance, Nyquist, Bode, Black, etc…
AN#9 – Linear vs. non linear systems in impedance measurements
AN#10 – Corrosion current measurement for an iron electrode in an acid solution
AN#11 – Calculation of the platinum’s active surface
AN#12 – UV-Visible Spectroscopy and Electrochemistry coupling: Spectroelectrochemical experiment feasibility on a polypyrrol film
AN#13 – VMP3 and Quartz Crystal Microbalance coupling: mass measurement during a polypyrrol film deposition
AN#14 – ZFit and equivalent electrical circuits
AN#15 – Two questions about Kramers-Kronig transformations
AN#16 – Simultaneous Impedance measurements on each element of a running cell stack
AN#17 – Drift correction in electrochemical impedance measurements
AN#18 – Staircase Potentio Electrochemical Impedance Spectroscopy and automatic successive ZFit analysis
AN#19 – EIS measurements with multisine
AN#20 – Pseudo capacitance calculation
AN#21 – Measurements of the double layer capacitance
AN#22 – Corrosion of reinforced concrete
AN#23 – EIS measurements on Li-ion batteries-EC-Lab software parameters adjustment
AN#24 – Photovoltaic Characterizations: Polarization and Mott Schottky plot
AN#25 – Multi Pitting Corrosion
AN#26 – Graphic Customization
AN#27 – Ohmic Drop: Part I: Effect on measurements
AN#28 – Ohmic Drop: Part II: Introduction to Ohmic Drop measurement techniques
AN#29 – Ohmic Drop Part III: Suitable use of the ZIR techniques?
AN#30 – IMVS investigation on photovoltaic cell
AN#31 – Fuel Cell Testing-Part I: Overview and I/E characterizations
AN#32 – Fuel Cell Testing-Part II: EIS characterization
AN#33 – Supercapacitors investigations-Part I: Charge/discharge cycling
AN#34 – Supercapacitors investigations-Part II: Time constant determination
AN#35 – Application of the Capacitance-Voltage curve to photovoltaic cell characterizations
AN#36 – VASP: An innovative and exclusive technique for corrosion monitoring
AN#37 – CASP: a new method for the determination of corrosion parameters
AN#38 – Dynamic resistance determination. A relation between AC and DC measurements?
AN#39-I – Electrochemical Noise Measurements-Part I : ASTM assessment and validation of the instrumental noise
AN#39-II – Electrochemical Noise Measurements-Part II : ASTM assessment and validation on a real electrochemical system
AN#39-III – Electrochemical Noise Measurements-Part III : Determination of the noise resistance Rn
AN#40 – Differential (Incremental) Capacity Analysis
AN#41-I – CV Sim-Simulation of the simple redox reaction (E)-Part I : The effect of the scan rate
AN#41-II – CV Sim-Simulation of the simple redox reaction (E)-Part II : The effect of the ohmic drop and the double layer capacitance
AN#42 – ZFit : The modified inductance element La.
AN#43 – How to fit transmission lines with ZFit
AN#44 – Artefacts in EIS measurements
AN#45 – Using ZFit for multiple cycles analysis
AN#46 – Dilatometer
AN#47 – Corrosion current determination with mass transfer limitation
AN#48 – Inaccuracy of the corrosion current determination in presence of an ohmic drop: EC-Lab® solutions
AN#49 – EIS measurements: Potentio (PEIS) vs. Galvano (GEIS) mode, that is the question!
AN#50-I – Math Reminder for electrochemists: I. The simplicity of complex number and impedance diagrams
AN#50-II – Math Reminder for electrochemists: II. The simplicity of Laplace transform
AN#51 – Supercapacitor characterization by galvanostatic polarization method
AN#52 – UFS-SEC: the spectroElectrochemical Cell for UV-Vis, NIR and IR measurement
AN#53 – Precision and Accuracy in Coulombic Efficiency Measurements. Sample data (.mpr 16 Mo).
AN#54 – How to read EIS accuracy contour plots
AN#55 – Interpretation problems of impedance measurements made on time variant systems
AN#56 – Electrochemical reaction kinetics measurement: the Levich and Koutecký-Levich analysis tools
AN#57 – Differential Coulometry Spectroscopy (DCS)
AN#58 – Cycling battery with reference electrode by using the PAT-cell test cell
AN#59 – A full solution to address battery module/pack.
AN#60 – Distribution of Relaxation Times (DRT): an introduction
AN#61 – How to interpret lower frequencies impedance in batteries ?
AN#62 – How to measure the internal resistance of a battery using EIS ?
AN#63 – High current (DC and EIS) measurements on electrolyzer ?
AN#64 – Introducing EC-Lab® EIS quality indicators: THD, NSD and NSR.
AN#65 – THD: parameters affecting its value and comparison with other methods of linearity assessment.
The application notes are here giving tips and results about how to use the techniques such as Scanning Electrochemical Spectroscopy in dc, ac and ic mode, Scanning Kelvin Probe and some various aspects of the software.
AN#1 – Height tracking with the SKP370 or SKP470 module
AN#2 – SECM height relief with OSP: An application in corrosion
AN#3 – SECM height relief with OSP: an application in sensors
AN#4 – Post-treatment and optimization of area scan experiments
AN#5 – Introducing the Microscopic Image Rapid Analysis (MIRA) software
AN#6 – Advantages of the intermittent contact SECM : two examples in corrosion
AN#7 – ac-SECM to investigate battery electrode materials in non-aqueous electrolyte
AN#8 – Graphical and analysis tools in M370/M470 software
AN#9 – SKP imaging example of a corroded Zn-plated Fe sample
AN#10 – dc- and ac-SECM Measurements on Si Nanowire Arrays
AN#11 – Measurement of a nano-patterned gold sample by ic-/ac-SECM
AN#12 – 3D Map production using the 3DIsoPlot software
AN#13 – Investigation of an interdigitated array electrode using ic-SECM
AN#14 – Introduction to the Modular Map Experiment: an Interdigitated Array electrode example
AN#15 – Introduction to the USB-PIO: measuring the effect of light on a live leaf
AN#16 – Intermittent Contact (ic) SECM for relief of major topographic features
AN#17 – The use of height tracking SECM to measure mechanically exfoliated graphite
AN#18 – Achieving micron scale measurements using the SECM150
AN#19 – Investigation of the diffusion of ferricyanide through porous membranes using the SECM150
AN#11 – MOS-500 – ORD accessory
AN#15 – SFM-2000 series – Submicrosecond dead time determination
AN#16 – SFM-2000 series – High precision volume delivery
AN#17 – SFM-2000 series – Precise control of flow rate
AN#18 – SFM-2000 series – High precision mixing ratios
AN#19 – SFM-2000 series – Automatic concentration dependance studies
AN#20 – SFM-2000 series – Wide temperature range control
AN#21 – SFM-2000 series – Double mixing stopped-flow using interrupted flow method
AN#22 – MOS-500 – Using MOS-500 for Magnetic Circular Dichroism
AN#23 – MOS-500 – DR-CD accessory for the determination of enantiomeric ratio
AN#24 – MOS-500 – Exciton coupled circular dichroism using MOS-500
AN#25 – SFM-2000 series – Stopped-flow in cryogenic conditions
AN#26 – MOS-500 – Changing the way to do Circular Dichroism
AN#27 – μSFM – Getting the most from a 50 μl stock of sample using the μSFM for refolding experiments
AN#28 – EkkO – Meniscus and beam position effects on measurement stability
AN#29 – EkkO – Evaporation Effects on Measurement Stability